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ESD Testing: From Components to Systems
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BAM 320
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ESD Testing: From Components to Systems is an invaluable reference for semiconductor chip and system-level ESD and EOS test engineers
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Detalji o proizvodu
| Publisher | Wiley |
| Publication date | December 27, 2016 |
| Edition | 1st |
| Language | English |
| Print length | 336 pages |
| ISBN-10 | 9780470511916 |
| ISBN-13 | 978-0470511916 |
| Item Weight | 1.42 pounds (640 grams) |
| Dimensions | 6.9 x 0.8 x 9.7 inches (17.5 x 2 x 24.6 cm) |
Who Should Buy?
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Engineers and Technicians
Ideal for professionals involved in product design, providing essential guidelines for effective ESD testing methodologies.
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Quality Assurance Teams
Useful for QA personnel who need comprehensive knowledge of ESD protection to improve product reliability and compliance.
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Educators and Students
Supports educators and students in electronics fields, offering a structured approach to understanding ESD testing concepts.
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General Consumers
Not suitable for everyday users who lack technical background or interest in electronic component testing.
OPIS PROIZVODA
ESD Testing: From Components to Systems
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Pros
- Compact design
- Lightweight
- Easy to use
Cons
- Limited functionality.
Product Price History
Važna informacija
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BAM 320
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Karakteristike i prednosti
- Invaluable reference for semiconductor chip and system-level ESD and EOS test engineers
- Provides understanding and knowledge of ESD models and specifications
- Discusses new testing methodologies such as transmission line pulse (TLP)
- Describes both conventional and new testing techniques for chip and system level evaluation
- Addresses EOS testing and electromagnetic compatibility (EMC) scanning
- Useful for semiconductor device and process development, circuit designers, and failure analysis engineers
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